10:30-15:00 GMT
Accurate device characterization, critical for system design success, is increasingly focused on providing single-sweep coverage over wide frequency ranges. Characterizing devices up to and beyond 220 GHz has been shown to improve model accuracy, even for lower-frequency applications. This trend is driven by the need for dependable circuit simulation and efficient first-time design turns. As applications like high-frequency communication and automotive radar push into higher gigahertz ranges, testing complexity grows.
The Seminar will explore the expanding role of Broadband on-wafer Vector Network Analyzer (VNA) measurements in modern microwave communication systems, particularly in the millimeter-wave up to 220 GHz. Attendees will gain insights into how advanced broadband VNA solutions, like Anritsu’s VectorStar ME7838G/4 220 GHz system and MPI probes, address these challenges by supporting single ended 2 to 4 ports as well as differential measurement requirements.
Special thanks to our external presenters from NPL and MPI who will share their expertise to demonstrate how these advancements are transforming device characterization and system design.
Register now and don’t miss the opportunity to discuss with experts & colleagues of the mmWave community!
11:05 - 11:45
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